New AFM

Location: Room , IPST

• Our new Atomic Force Microscope (AFM), has been the instrument of choice for three dimensional measurements at the nanometer scale.
• With the conductive AFM compatibility, the MFP-3D AFM is ideal for many applications.

Head and base:

Location: Room , IPST

• Sensored optical lever with diffraction limited optics and a low coherence light source virtually eliminates interference artifacts.
• The NPS sensored Z axis provides precise measurements of the cantilever position for accurate force and topography measurements.

Controller:

Location: Room , IPST

• 100% digital for low noise, fast operation, and flexibility
• Field Programmable Gate Array (FPGA) and Digital Signal Processor (DSP)
• Fast analog-to-digital/digital-to-analog conversions